Preparation and Characterization of Hydrothermally Grown ZnO Nanorods for Photoconductive Sensors Applications
نویسندگان
چکیده
ZnO nanorods (NRs) were deposited on p-type silicon (Si) wafers by low-temperature hydrothermal method. The structural morphology of the ZnO-NR films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM) respectively. The ZnO-NR films exhibit wurtzite ZnO structure and the average length of the ZnO-NRs were in the range from 750 nm to 800 nm. The electrical characterization of the Al/ZnO-NR contacts was studied by using microprobe arrangement. The study demonstrates that Al/ZnO-NR ohmic contact fabricated by a simple and inexpensive method can be used for fabrication of photoconductive sensors applications.
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